Design of Embedded Memory and Logic Based On Pattern Constructs

D. Morris, K. Vaidyanathan, N. Lafferty, K. Lai, L. Liebmann, L. Pileggi, “Design of Embedded Memory and Logic Based On Pattern Constructs”, IEEE Symposium on VLSI (Invited Presentation), June 2011.

Virtual Phase Noise Sensor for Self-Healing Voltage Controlled Oscillators

S. Yaldiz, F. Wang, X. Li, L. Pileggi, A.S. Natarajan, M.A. Ferriss, J. Tierno, “Virtual Phase Noise Sensor for Self-Healing Voltage Controlled Oscillators”, GOMACTech-11 Technical Program, March 2011.

Performance and Manufacturability Trade-offs of Pattern Minimization for sub-22nm Technology Nodes

V. Rovner, T. Jhaveri, Daniel Morris, Andrzej J. Strojwas, and Larry Pileggi, “Performance and Manufacturability Trade-offs of Pattern Minimization for sub-22nm Technology Nodes”, SPIE Advanced Lithography Conference, February 2011.

Statistical Modeling and Post Manufacturing Configuration for Scaled Analog CMOS

G. Keskin, J. Proesel and L. Pileggi, “Statistical Modeling and Post Manufacturing Configuration for Scaled Analog CMOS”, Int’l Custom Integrated Circuits Conference, Sept. 2010.

Reducing Variability in Chip-Multiprocessors with Adaptive Body Biasing

A. Bonnoit, S. Herbert and L. Pileggi, “Reducing Variability in Chip-Multiprocessors with Adaptive Body Biasing”, International Symposium on Low Power Electronics and Design, August 2010.

Modeling of Statistical Element Selection Based Self-Healing Analog Circuits

G. Keskin, J. Proesel and L. Pileggi, “Modeling of Statistical Element Selection Based Self-Healing Analog Circuits”, Proceedings of the SRC Techcon Conference, September 2010.

 

Enabling Application-Specific Integrated Circuits on Limited Pattern Constructs

D. Morris, S. Rovner, L. Pileggi, A. Strojwas and K. Vaidyanathan, “Enabling Application-Specific Integrated Circuits on Limited Pattern Constructs”, IEEE Symposium on VLSI (Invited Presentation), June 2010.

Design Technology Co-optimization for Predictive Technology Scaling Beyond Gratings, Invited Keynote Paper

Tejas Jhaveri, Vyacheslav Rovner, Lars Liebmann, Larry Pileggi, Andrzej Strojwas, Jason D. Hibbeler, “Design Technology Co-optimization for Predictive Technology Scaling Beyond Gratings, Invited Keynote Paper”, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 29, no. 4, April 2010.

Demonstrating the benefits of template-based design-technology co-optimization

L. Liebmann, J. Hibbeler, N. Hieter, L. Pileggi, M. Moe, T. Jhaveri, V. Rovner, “Demonstrating the benefits of template-based design-technology co-optimization”, SPIE Advanced Lithography Conference, February 2010.

Application of the Cost-Per-Good-Die Metric for Process-Design Co-optimization

T. Jhaveri, U. Urslan, V. Rovner, L. Pileggi & A. J. Strojwas, “Application of the Cost-Per-Good-Die Metric for Process-Design Co-optimization”, SPIE Advanced Lithography Conference, Selected for Keynote Presentation, February 2010.