Reducing Power Supply Noise in Integrated Circuits Using Active Resistors

G. Keskin, X. Li and L. Pileggi, “Reducing Power Supply Noise in Integrated Circuits Using Active Resistors”, Proceedings of the SRC Techcon Conference, October 2005.

Timing Driven Initial Placement for FPGAs via Graph Matching

P. Gopalakrishnan and L. Pileggi, “Timing Driven Initial Placement for FPGAs via Graph Matching”, Proceedings of the SRC Techcon Conference, October 2005.

Correlation-Aware Statistical Timing Analysis with Non-Gaussian Delay Distributions

Y. Zhan, X. Li, A. Strojwas, and L. Pileggi, “Correlation-Aware Statistical Timing Analysis with Non-Gaussian Delay Distributions”, Design Automation Conference, June 2005.

Design Methodology for IC Manufacturability Based on Regular Logic-Bricks

V. Kheterpal, T. Hersan, V. Rovner, D. Motiani, Y. Takagawa, L. Pileggi and A. Strojwas, “Design Methodology for IC Manufacturability Based on Regular Logic-Bricks”, Design Automation Conference, June 2005.

OPERA: OPtimization with Ellipsoidal uncertainty for Robust Analog IC design

Y. Xu, K. L. Hsiung, L. Pileggi, and S. Boyd, “OPERA: OPtimization with Ellipsoidal uncertainty for Robust Analog IC design”, Design Automation Conference, June 2005.

Metal-mask Configurable RF Integrated Circuits

Y. Xu and L. Pileggi, “Metal-mask Configurable RF Integrated Circuits”, GOMACTech-05 Technical Program, April 2005.

Robust Optimization for Radiation Hardened Analog/RF Circuits

X. Li, K.Y. Tong, Y. Xu and L. Pileggi, “Robust Optimization for Radiation Hardened Analog/RF Circuits”, GOMACTech-05 Technical Program, April 2005.

Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction

P. Li and L. Pileggi, “Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction”, Design and Test in Europe Conference (DATE), February 2005.

Specification Test Compaction for Analog Circuits and MEMS

S. Biswas, P. Li, S. Blanton and L. Pileggi, “Specification Test Compaction for Analog Circuits and MEMS”, Design and Test in Europe Conference (DATE), February 2005.

Compact Reduced-Order Modeling of Weakly Nonlinear Analog and RF Circuits

P. Li and L. T. Pileggi, “Compact Reduced-Order Modeling of Weakly Nonlinear Analog and RF Circuits”, IEEE Transactions on Computer-Aided Design, Vol. 23, No. 2, pp. 184-203, February 2005.