Metrics for RLC Transmission Line Termination
John Willis, Rohini Gupta and L.T. Pillage, “Metrics for RLC Transmission Line Termination”, IEEE Sponsored Topical Meeting on Electrical Performance of Electronic Packaging, November 1994.
This author has yet to write their bio.Meanwhile lets just say that we are proud awp contributed a whooping 431 entries.
John Willis, Rohini Gupta and L.T. Pillage, “Metrics for RLC Transmission Line Termination”, IEEE Sponsored Topical Meeting on Electrical Performance of Electronic Packaging, November 1994.
L.T. Pillage and R.A. Rohrer, “The Essence of AWE”, Circuits and Devices Magazine, November 1994.
R. Gupta, S.Y. Kim and L.T. Pillage, “Domain Characterization of Transmission Line Models for Efficient Simulation”, Proceedings of the International Conference on Computer Design, October 1994.
S.Y. Kim, N. Gopal and L.T. Pillage, “Time-Domain Macromodels for VLSI Interconnect Analysis”, IEEE Transactions on Computer-Aided Design, pp. 1257-1270, October 1994.
F. Dartu, N. Menezes, J. Qian and L.T. Pillage, “A Gate Delay Model for High Performance CMOS”, Proceedings Design Automation Conference, June 1994.
R. Gupta and L.T. Pillage, “OTTER: Optimal Termination of Transmission Lines Excluding Radiation”, Proceedings Design Automation Conference, June 1994.
D.F. Anastaskis, N. Gopal, S.Y. Kim and L.T. Pillage, “On the Stability of Moment- Matching Approximations in Asymptotic Waveform Evaluation”, IEEE Transactions on Computer-Aided Design, pp. 729-736, June 1994.
C. Ratzlaff and L.T. Pillage, “RICE: Rapid Interconnect Circuit Evaluation Using Asymptotic Waveform Evaluation”, IEEE Transactions on Computer-Aided Design, pp. 763-776, June 1994.
N. Gopal, A. Balivada and L.T. Pillage, “Moment-Matching Approximations for Linear(ized) Circuit Analysis, Semiconductors in IMA Volumes in Mathematics and it’s Applications”, F. Odeh, J. Cole, W. M. Coughran, Jr., P. Lloyd, and J. White, editors, Springer-Verlag, pp. 115-130, May 1994.
R.B. Brashear, N. Menezes, C. Oh, L.T. Pillage and M.R. Mercer, “Predicting Circuit Performance Using Circuit-Level Statistical Timing Analysis”, Proceedings of the European Design Automation Conference, February 1994.
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