Post-Silicon Calibration of Analog CMOS Using Phase-Change Memory Cells

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C.-Y. Wen, J. Paramesh, L. T. Pileggi, J. Li, S. Kim, J. Proesel, C. Lam, “Post-Silicon Calibration of Analog CMOS Using Phase-Change Memory Cells”, European Solid-State Device Research Conference (ESSDERC), September 2011.

Using Continuization in Reachability Analysis for the Verification of a Phase-Locked Loop

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M. Althoff, A. Rajhans, B.H. Krogh, S. Yaldiz, X. Li, L. Pileggi, “Using Continuization in Reachability Analysis for the Verification of a Phase-Locked Loop”, In Proc. Frontiers in Analog Circuit (FAC) Synthesis and Verification, July 2011.

Design Without Rules: A Pattern Construct Methodology

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D. Morris, K. Vaidyanathan and L. Pileggi, “Design Without Rules: A Pattern Construct Methodology”, Proceedings of the SRC Techcon Conference, September 2011.

Design of Embedded Memory and Logic Based On Pattern Constructs

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D. Morris, K. Vaidyanathan, N. Lafferty, K. Lai, L. Liebmann, L. Pileggi, “Design of Embedded Memory and Logic Based On Pattern Constructs”, IEEE Symposium on VLSI (Invited Presentation), June 2011.

A Non-volatile Look-Up Table Design Using PCM (Phase-Change Memory) Cells

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C.-Y. Wen, J. Li, S. Kim, M. Breitwisch, C. Lam, J. Paramesh, L. T. Pileggi, “A Non-volatile Look-Up Table Design Using PCM (Phase-Change Memory) Cells”, IEEE Symposium on VLSI, June 2011.

8-bit Flash ADC Design Based on Post-Manufacturing Statistical Element Selection

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Gokce Keskin, Jon Proesel and Larry Pileggi, “8-bit Flash ADC Design Based on Post-Manufacturing Statistical Element Selection”, IEEE Journal of Solid State Circuits (Invited), Volume 46 , Issue 8, May 2011.

Virtual Phase Noise Sensor for Self-Healing Voltage Controlled Oscillators

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S. Yaldiz, F. Wang, X. Li, L. Pileggi, A.S. Natarajan, M.A. Ferriss, J. Tierno, “Virtual Phase Noise Sensor for Self-Healing Voltage Controlled Oscillators”, GOMACTech-11 Technical Program, March 2011.

Performance and Manufacturability Trade-offs of Pattern Minimization for sub-22nm Technology Nodes

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V. Rovner, T. Jhaveri, Daniel Morris, Andrzej J. Strojwas, and Larry Pileggi, “Performance and Manufacturability Trade-offs of Pattern Minimization for sub-22nm Technology Nodes”, SPIE Advanced Lithography Conference, February 2011.

A Phase-change via-Reconfigurable On-Chip Inductor

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C.-Y. Wen, E. K. Chua, R. Zhao, T. C. Chong, J. A. Bain, T. E. Schlesinger, L. T. Pileggi, J. Paramesh, “A Phase-change via-Reconfigurable On-Chip Inductor”, International Electron Devices Meeting, December 2010.

An 8-bit 1.5GS/s Flash ADC Using Post-Manufacturing Statistical Selection

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J. Proesel, G. Keskin, J.O. Plouchart and L. Pileggi, “An 8-bit 1.5GS/s Flash ADC Using Post-Manufacturing Statistical Selection”, Int’l Custom Integrated Circuits Conference, Sept. 2010.