A 0.6-to-1V Inverter-Based 5-bit Flash ADC in 90nm Digital CMOS
J. Proesel and L. Pileggi, ‘A 0.6-to-1V Inverter-Based 5-bit Flash ADC in 90nm Digital CMOS’, Int’l Custom Integrated Circuits Conference, Sept. 2008.
Variation-Tolerant SRAM Sense-Amplifier Timing Using Configurable Replica Bitlines
/0 Comments/in Conference, Integrated Circuits, Publications /by awpU. Arslan, M. McCartney, M. Bhargava, X. Li, K. Mai and L. Pileggi, “Variation-Tolerant SRAM Sense-Amplifier Timing Using Configurable Replica Bitlines”, Int’l Custom Integrated Circuits Conference, Sept. 2008.
Mismatch Analysis and Statistical Design at 65 nm and Below
/0 Comments/in Conference, Electronic Design Automation, Publications /by awpL. Pileggi, G. Keskin, X. Li, K. Mai and J. Proesel, “Mismatch Analysis and Statistical Design at 65 nm and Below”, Invited Paper, Int’l Custom Integrated Circuits Conference, Sept. 2008.
Variation-Tolerant SRAM Sense-Amp Timing using Configurable Replica Bitlines
/0 Comments/in Conference, Integrated Circuits, Publications /by awpU. Arslan, M. McCartney, M. Bhargava, L. Pileggi and K. Mai, “Variation-Tolerant SRAM Sense-Amp Timing using Configurable Replica Bitlines”, Proceedings of the SRC Techcon Conference, September 2008.
A 0.6-to-1V Inverter-Based 5-bit Flash ADC in 90nm Digital CMOS
/0 Comments/in Conference, Integrated Circuits, Publications /by awpJ. Proesel and L. Pileggi, “A 0.6-to-1V Inverter-Based 5-bit Flash ADC in 90nm Digital CMOS”, Proceedings of the SRC Techcon Conference, September 2008.
Process Variation Effects on Input Offset Voltage of CMOS SRAM Sense Amplifiers
/0 Comments/in Conference, Electronic Design Automation, Integrated Circuits, Publications /by awpG. Keskin, L. Pileggi, X. Li and K. Mai, “Process Variation Effects on Input Offset Voltage of CMOS SRAM Sense Amplifiers”, Proceedings of the SRC Techcon Conference, September 2008.
Thermal Analyses of Confined Cell Design for Phase Change Random Access Memory (PCRAM)
/0 Comments/in Conference, Electronic Design Automation, Publications /by awpE. Small, S.M. Sadeghipour, L. Pileggi, M. Asheghi, “Thermal Analyses of Confined Cell Design for Phase Change Random Access Memory (PCRAM)”, ITherm, May 2008.
Enabling Technology Scaling with ‘In Production’ Lithography Processes
/0 Comments/in Conference, Electronic Design Automation, Publications /by awpT. Jhaveri, A.J. Strojwas, L. Pileggi, V. Rovner, “Enabling Technology Scaling with ‘In Production’ Lithography Processes”, SPIE Advanced Lithography Conference, February 2008.
Automated Testability Enhancements for Logic Brick Libraries
/0 Comments/in Conference, Electronic Design Automation, Publications /by awpJ. Brown, B. Taylor, R. D. Blanton, and L. Pileggi, “Automated Testability Enhancements for Logic Brick Libraries”, Proceedings of Design and Test Europe, March 2008.
Exact Methods for Physical Design of Regular Logic Bricks
/0 Comments/in Conference, Electronic Design Automation, Publications /by awpB. Taylor and L. Pileggi, “Exact Methods for Physical Design of Regular Logic Bricks”, Proceedings of the SRC Techcon Conference, October 2007.
Contact
Carnegie Mellon University
Hamerschlag Hall, 2113
5000 Forbes Avenue
Pittsburgh, PA 15213-3891 USA
pileggi@andrew.cmu.edu
Phone: 412-268-6774