A Sparse Image Method for BEM Capacitance Extraction
Byron Krauter, Yu Xia, Aykut Dengi, Lawrence T. Pileggi, “A Sparse Image Method for BEM Capacitance Extraction”, Proceedings of the Design Automation Conference, 1996.
This author has yet to write their bio.Meanwhile lets just say that we are proud awp contributed a whooping 431 entries.
Byron Krauter, Yu Xia, Aykut Dengi, Lawrence T. Pileggi, “A Sparse Image Method for BEM Capacitance Extraction”, Proceedings of the Design Automation Conference, 1996.
Bogdan Tutuianu and Lawrence Pileggi, “An Explicit RC-Circuit Delay Approximation Based on the First Three Moments of the Impulse Response”, Proceedings of the Design Automation Conference , 1996.
F. Dartu, N. Menezes and L.T. Pileggi, “Performance Computation for Pre-characterized CMOS Gates with RC Loads”, IEEE Transactions on Computer-Aided Design, pp. 544-553, May 1996.
Rohini Gupta, Seok-Yoon Kim and Lawrence Pileggi, “Domain Characterization of Transmission Line Models and Analyses”, IEEE Transactions on Computer-Aided Design, pp. 184-193, February 1996.
R. Gupta, B. Krauter and L. Pileggi, “On Moment Based Metrics for Optimal Termination of Transmission Line Interconnects”, Proceedings of the 9th International Conference on VLSI Design, January 1996.
M. Kamon, B. Krauter, J. Phillips, L. Pileggi, and J. White, “Two Optimizations to Accelerated Method-of-Moments Algorithms for Signal Integrity Analysis of Complicated 3-D Packages”, IEEE Sponsored Topical Meeting on Electrical Performance of Electronic Packaging, November 1995.
R. Gupta, B. Krauter, B. Tutuianu, J. Willis and L. Pileggi, “The Elmore Delay as a Bound for RC-Trees with Generalized Input Signals”, Proceedings of the Design Automation Conference, 1995.
N. Menezes, S. Pullela and L. Pileggi, “Simultaneous Gate and Interconnect Sizing for Circuit-Level Delay Optimization”, Proceedings of the Design Automation Conference, 1995.
B. Krauter, R. Gupta, J. Willis and L. Pileggi, “Transmission Line Synthesis”, Proceedings of the Design Automation Conference , 1995.
I. Tesu and L. Pileggi, “Timing Analysis Models for Gates and Cells with Bipolar Transistor Output Stages”, Proceedings of the IEEE ASIC Conference, 1995.
Carnegie Mellon University
Hamerschlag Hall, 2113
5000 Forbes Avenue
Pittsburgh, PA 15213-3891 USA
pileggi@andrew.cmu.edu
Phone: 412-268-6774