Detecting Reliability Attacks during Split Fabrication using Test-only BEOL Stack

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K. Vaidyanathan, B. Prasad Das, L. Pileggi, “Detecting Reliability Attacks during Split Fabrication using Test-only BEOL Stack”, IEEE/ACM Design Automation Conference, June 2014.

Fabrication Challenges in Developing All-Metal Magnetic Logic Circuits

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M. T. Moneck, V. Sokalski, D. M. Bromberg, J. Wu, Z. Dai, L. Pileggi, J.-G. Zhu, “Fabrication Challenges in Developing All-Metal Magnetic Logic Circuits”, 2014 International Magnetics Conference.

mLogic: All Spin Logic Device and Circuits for Future Electronics

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J.-G. Zhu, D. Bromberg, V. Sokalski, M.T. Moneck, J. Wu, Z. Dai, L. Pileggi, “mLogic: All Spin Logic Device and Circuits for Future Electronics”, IEEE Transactions on Magnetics, INTERMAG 2014.