S. Biswas, P. Li, S. Blanton and L. Pileggi, “Specification Test Compaction for Analog Circuits and MEMS”, Design and Test in Europe Conference (DATE), February 2005.
http://users.ece.cmu.edu/~pileggi/wp-content/uploads/2020/05/CMU-logo-v4.png00awphttp://users.ece.cmu.edu/~pileggi/wp-content/uploads/2020/05/CMU-logo-v4.pngawp2005-02-01 08:00:002018-06-28 15:34:56Specification Test Compaction for Analog Circuits and MEMS
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