H. Zhang, B. Krauter, M. Beattie and L. Pileggi, “Window-Based Susceptance Models for Large-Scale RLC Circuit Analyses”, Design and Test in Europe Conference (DATE), March 2002.
http://users.ece.cmu.edu/~pileggi/wp-content/uploads/2020/05/CMU-logo-v4.png00awphttp://users.ece.cmu.edu/~pileggi/wp-content/uploads/2020/05/CMU-logo-v4.pngawp2002-03-01 08:00:002018-06-28 15:50:33Window-Based Susceptance Models for Large-Scale RLC Circuit Analyses
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