L. Pileggi, G. Keskin, X. Li, K. Mai and J. Proesel, “Mismatch Analysis and Statistical Design at 65 nm and Below”, Invited Paper, Int’l Custom Integrated Circuits Conference, Sept. 2008.
http://users.ece.cmu.edu/~pileggi/wp-content/uploads/2020/05/CMU-logo-v4.png00awphttp://users.ece.cmu.edu/~pileggi/wp-content/uploads/2020/05/CMU-logo-v4.pngawp2008-10-06 08:00:002019-02-13 14:48:02Mismatch Analysis and Statistical Design at 65 nm and Below
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