SRAM Parametric Failure Analysis, Proceedings of ACM/IEEE Design Automation Conference

J. Wang, S. Yaldiz, X. Li and L. Pileggi, “SRAM Parametric Failure Analysis, Proceedings of ACM/IEEE Design Automation Conference”, June 2009.

Creating an Affordable 22nm Node using Design-Lithography Co-Optimization

A. J. Strojwas, T. Jhaveri, V. Rovner and L. Pileggi, “Creating an Affordable 22nm Node using Design-Lithography Co-Optimization”, Proceedings of ACM/IEEE Design Automation Conference, June 2009.