Efficient Parametric Yield Extraction for Multiple Correlated Non-Normal Performance Distributions of Analog/RF Circuits

X. Li and L. Pileggi, “Efficient Parametric Yield Extraction for Multiple Correlated Non-Normal Performance Distributions of Analog/RF Circuits”, Proceedings of ACM/IEEE Design Automation Conference, June 2007.

Exact Combinatorial Optimization Methods for Physical Design of Regular Logic Bricks

B.Taylor and L. Pileggi, “Exact Combinatorial Optimization Methods for Physical Design of Regular Logic Bricks”, Proceedings of ACM/IEEE Design Automation Conference, June 2007.

Parameterized Macromodeling for Analog System-Level Design Exploration

J. Wang, X. Li and L. Pileggi, “Parameterized Macromodeling for Analog System-Level Design Exploration”, Proceedings of ACM/IEEE Design Automation Conference, June 2007.

,Regular Layout Performance Dependence on Cell Abutment

K. Yu, S. Wang, A. Gerdemann, C. Weldon, D. Reber, J. Vasek, S. Veeraraghavan, V. Rovner, T. Jhaveri, T. Hersan, L. Pileggi”,Regular Layout Performance Dependence on Cell Abutment”, Joint Conference on Design For Manufacturing, June 2007.