Notes on:
"Automotive Electronic Reliability Prediction", William Denson and Mary Priore, SAE paper 870050. Automotive Electronics Reliability SP-696, SAE Warrendale PA, 1987, pp. 1-11.
This is an alternative to MIL-HDBK-217 for automotive applications. Includes both equations and data values for representative automotive component reliability calculations. Components covered include microcircuits, transistors, diodes, capacitors, and resistors. Both pi and lambda values are included for a variety of vehicle location and component technology types based on field data. Data includes effects of non-operational periods.
Topic coverage: (*** = emphasized; ** = discussed with some detail; * = mention)
| *** | Dependability | *** | Electronic Hardware | Requirements | |||||
| Safety | Software | ** | Design | ||||||
| Security | Electro-Mechanical Hardware | Manufacturing | |||||||
| Scalability | Control Algorithms | Deployment | |||||||
| Latency | Humans | Logistics | |||||||
| Affordability | Society/Institutions | Retirement |
Other topics: dependability math, data, common-cause failures, dependability assessment
Abstract:
"The intent of this paper is to present updates to and further developments of the automotive electronic component reliability prediction models previously developed and summarized in SAE paper 840486. The relatively simplistic models presented previously have been further developed to account for factors such as temperature, decreasing failure rate with time, and nonoperating period failure rates. Models have been developed for microcircuits, diodes, transistors, capacitors, and resistors. These efforts are part of an on-going activity of the electronic reliability subcommittee of the SAE's electronics committee to analyze failure rate information on automotive electronic components and provide the automotive community with a means to predict electronic reliability."
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Philip Koopman: koopman@cmu.edu