Archive for month: June, 2016

Extended Statistical Element Selection: A Calibration Method for High Resolution in Analog/RF Designs

June 1, 2016/0 Comments/in Conference, Integrated Circuits, Publications /by awp

R. Liu, J. Weldon and L. Pileggi, “Extended Statistical Element Selection: A Calibration Method for High Resolution in Analog/RF Designs”, Design Automation Conference (DAC 2016), June 2016.

Archive for month: June, 2016

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