Specification Test Compaction for Analog Circuits and MEMS
S. Biswas, P. Li, S. Blanton and L. Pileggi, “Specification Test Compaction for Analog Circuits and MEMS”, Design and Test in Europe Conference (DATE), February 2005.
Archive for month: February, 2005
Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction
/0 Comments/in Conference, Electronic Design Automation, Publications /by awpP. Li and L. Pileggi, “Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction”, Design and Test in Europe Conference (DATE), February 2005.
Compact Reduced-Order Modeling of Weakly Nonlinear Analog and RF Circuits
/0 Comments/in Electronic Design Automation, Peer Reviewed, Publications /by awpP. Li and L. T. Pileggi, “Compact Reduced-Order Modeling of Weakly Nonlinear Analog and RF Circuits”, IEEE Transactions on Computer-Aided Design, Vol. 23, No. 2, pp. 184-203, February 2005.
Contact
Carnegie Mellon University
Hamerschlag Hall, 2113
5000 Forbes Avenue
Pittsburgh, PA 15213-3891 USA
pileggi@andrew.cmu.edu
Phone: 412-268-6774