Notes on:
Nonoperating Reliability DatabookReliability Analysis Center |
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Nonoperating Reliability Databook, Reliability Analysis Center, Griffiss AFB, Rome NY, 1987 (329 pages+). Document F30602-84-C-0162.
I DON'T PUBLISH NOR SELL THIS BOOK -- CONTACT RAC FOR INFO ON OBTAINING IT!
This data source provides quantitative models based on real data for how components degrade over time spent in storage. The book was primarily conceived to provide reliability information about spare parts or consumable equipment that may be stockpiled and stored for years before being used (the failure rate is expressed in failures per million storage hours). However many embedded systems spend a significant part of their life in short-term storage, such as an automobile parked in a garage, so nonoperating reliability can play a big part in everyday systems.
The failure rates take into account factors such as storage conditions, failure mechanisms, type of component, and how often the component is tested while in storage. Some of the information has a decidedly military flavor (e.g., missiles), and would have to be adapted for commercial use. The data covers: resistors, capacitors, inductors, diodes, transistors, microcircuits, hybrids, tubes, relays, switches, meters, connectors, and "miscellaneous" (accelerometers, batteries, pumps, switches, valves).
The data may be somewhat dated and perhaps more applicable to military-grade components than commercial components. However, it is the most comprehensive data of this type available.
Topic coverage: (*** = emphasized; ** = discussed with some detail; * = mentioned)
*** | Dependability | *** | Electronic Hardware | Requirements | |||||
Safety | Software | Design | |||||||
Security | *** | Electro-Mechanical Hardware | Manufacturing | ||||||
Scalability | Control Algorithms | Deployment | |||||||
Latency | Humans | *** | Logistics | ||||||
Affordability | Society/Institutions | Retirement |
Author summary (from the preface):
"This publication is the first RAC databook devoted entirely to one specific field use condition. NONOP-1 is a compilation of nonoperating field and test data for an assortment of electrical and electromechanical parts. The data presented have been collected by the Reliability Analysis Center (RAC) from many government and nongovernment sources and resides in RAC databases.
"NONOP-1 provides summarized and unsummarized data on a variety of part types. Records are grouped into various logical sub-categories to allow quick comparisons between related part types. Summary data tables provide field failure rates for the merged data records along with their respective predicted failure rate values. Predicted failure rates have been derived using RAC's Nonoperating Reliability Prediction System (RAC-NPRS) which is based on RADC Technical Report, Impact of Nonoperating Periods on Equipment Reliability, RADC-TR-85-91. A component failure rate section for miscellaneous components which are not currently represented by reliability prediction models and a section outlining the effects of periodically testing nonoperating systems are also presented. This book is intended to complement documents such as RADC-TR-85-91 or MIL-HDBK-217. Users are cautioned that any data presented herein may not be used in lieu of contractually cited references."
INTRODUCTION 1 SECTION 1: BACKGROUND 3 Background 5 Assumptions 7 Data Types 9 SECTION 2: OVERVIEW 11 General 13 Environmental Analysis 13 Component Failure Mechanisms Due to the Effects of Storage 20 Microcircuit Failure Mechanisms 21 Diodes & Transistors 29 Electronic Tubes 29 Resistors 30 Capacitors 30 Inductors 31 Connectors 31 Effects of Periodic Testing on System Reliability 31 RAC Tools for Predicting Nonoperational Reliability 38 SECTION 3: DATA TABLES 39 Data Files 41 Nonoperational Component Reliability Summary Section 49 Nonoperational Component Reliability Detail Data Section 65 Resistors 67 Capacitors 101 Inductors 133 Diodes 147 Transistors 167 Microcircuit Field Data 185 Microcircuit Test Data 211 Hybrids 245 Tubes 255 Relays 267 Switches 277 Meters 289 Connectors 297 Miscellaneous 307 REFERENCES 319 APPENDIX A: PERIODIC TEST MODEL DERIVATION 323
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Philip Koopman: koopman@cmu.edu